McGill University, May 12-13, 2016
Increase Your AFM Knowledge for Measuring Nanoelectrical and Nanomechanical Properties
The aim of this workshop is to educate our local community of atomic force microscopy (AFM) users who want to gain valuable knowledge and experience in measuring these properties for materials and biological applications. The workshop is ideal for those that have some AFM experience and would like to enhance their skills for use in their own research.
Morning lectures will be presented by leading researchers and will cover:
• Measuring nanomechanical and nanoelectrical properties
• Sample preparation
• Image artifacts
• Data analysis and interpretation
Afternoons will focus on equipment demonstrations. Learn tips and tricks on imaging techniques, sample prep, and more from the experts.
- Dr. Emily Cranston, Assistant Professor, McMaster University
- Dr. Peter Grutter, Chair, Dept. of Physics, McGill University
- Donald McGillivray, Graduate Teaching Assistant, University of Waterloo
- Jason Wang, Research Engineer, University of New Brunswick
- Sophia Hohlbauch & Keith Jones, Applications Scientists, Asylum Research
- Rob Cain, US Technical Sales Manager, Asylum Research
Poster Session and Happy Hour
All attendees are encouraged to bring a poster for the poster session.
Prizes will be awarded.
Registration is $50 and includes all lunches, breaks and poster session.
Register at oxford-instruments.com/McGill-Workshop
Ernest Rutherford Physics Building, Room 103 (Bell Room)
3600 Rue University
Montreal, QC H3A 2T8 Canada
Nushaw Ghofranian, 805-696-6466, email@example.com, www.oxford-instruments.com/McGill-Workshop