Search form

TitleReview of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements.
Publication TypeJournal Article
Year of Publication2019
AuthorsMascaro, Aaron, Yoichi Miyahara, Tyler Enright, Omur E. Dagdeviren, and Peter Grutter
JournalBeilstein J Nanotechnol
Volume10
Pagination617-633
Date Published2019
ISSN2190-4286
Abstract

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

DOI10.3762/bjnano.10.62
Alternate JournalBeilstein J Nanotechnol
PubMed ID30873333
PubMed Central IDPMC6404404